In Situ TEM Biasing & Heating
Sample Dynamics under controlled electrical and thermal environment
闪电原位偏置和加热系列为您提供了获取有关温度和/或电场触发的样品动力学的实时信息的能力。通过闪电系列研究下一代的纳米电子材料和设备。
闪电纳米芯片：最多8个触点，用于同时偏见和加热
The Lightning range of Nano-Chips provides researchers with the ability to control the biasing and heating environment of their sample with the highest of precision. Available in different configurations, the Lightning Nano-Chip ensures the full atomic resolution imaging power of the TEM can be maintained while creating the real-world application environment.
MEMS Based Technology
The Lightning Nano-Chips use the latest in MEMS technology to create the lab-on-chip biasing and thermal environment. The unique properties in using metal heating and biasing lines, along with the unique Nano-Chip design provides in situ researchers with the ultimate in control and accuracy.
Sample preparation with conventional techniques
The sample preparation techniques used for preparing traditional TEM samples including lamellas, nanowires and particles are suitable for the Nano-Chip. FIB lamellas are the most commonly used sample for biasing experiments and DENSsolutions in conjunction with some close academic partners have developed a unique FIB workflow using a customised FIB stub specifically designed for the Nano-Chip. This process significantly reduces the total workflow time and makes the success in transfer much higher. Additional methods such as micro-manipulators are suitable for sample preparation onto the Nano-Chip.
Biasing
同时加热和偏见
Resolution
Application Fields:
- Piezoelectrics
- ReRam
- 太阳能电池